C. Comboroure: search on Z-Library

The world's largest scientific articles store. 70,000,000+ articles for free.

1

Patterning Strategy for Monoelectronic Device Platform in a Complementary Metal Oxide Semiconductor Technology

S. Pauliac-vaujour, R. Wacquez, C. Vizioz, T. Chevolleau, M. Pierre, B. Previtali, C. Comboroure, N. Bove, B. Roche, M. Vinet, X. Jehl, M. Sanquer, P. Sixt

Year:

2011

Language:

english

File:

PDF, 904 KB

english, 2011

2

Study of carrier transport in strained and unstrained SOI tri-gate and omega-gate silicon nanowire MOSFETs

Koyama, M., Cassé, M., Coquand, R., Barraud, S., Vizioz, C., Comboroure, C., Perreau, P., Maffini-Alvaro, V., Tabone, C., Tosti, L., Barnola, S., Delaye, V., Aussenac, F., Ghibaudo, G., Iwai, H., Reim

Journal:

Solid-State Electronics

Year:

2013

Language:

english

File:

PDF, 870 KB

english, 2013

3

COL04-01: Développer l’utilisation d’antibiogrammes ciblés

Comboroure, J.-C.

Journal:

Médecine et Maladies Infectieuses

Year:

2014

Language:

french

File:

PDF, 166 KB

french, 2014

4

Capped carbon hard mask and trimming process: A low-cost and efficient route to nanoscale devices

Pauliac-Vaujour, Sébastien, Brianceau, Pierre, Comboroure, Corinne, Faynot, Olivier

Journal:

Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures

Year:

2013

Language:

english

File:

PDF, 3.14 MB

english, 2013

5

[ECS 214th ECS Meeting - Honolulu, HI (October 12 - October 17, 2008)] ECS Transactions - Dry Etch Challenges in Gate All Around Devices for sub 32 nm Applications

Barnola, Sebastien, Vizioz, Christian, Vulliet, Nathalie, Dupré, Cécilia, Ernst, Thomas, Gautier, Pauline, Arvet, Christian, Guillaumot, Bernard, Bernard, Emilie, Pauliac-Vaujeour, S., Comboroure, C

Year:

2008

Language:

english

File:

PDF, 4.20 MB

english, 2008

6

Perception de la vaccination et rôle du pharmacien d’officine : une enquête auprès des étudiants en dernière année de pharmacie en France

Comboroure, J.-C., Mueller, J.-E.

Journal:

Annales Pharmaceutiques Françaises

Year:

2014

Language:

french

File:

PDF, 600 KB

french, 2014

7

[IEEE 2017 IEEE International Electron Devices Meeting (IEDM) - San Francisco, CA, USA (2017.12.2-2017.12.6)] 2017 IEEE International Electron Devices Meeting (IEDM) - Performance and design considerations for gate-all-around stacked-NanoWires FETs

Barraud, S., Lapras, V., Previtali, B., Samson, M. P., Lacord, J., Martinie, S., Jaud, M.-A., Athanasiou, S., Triozon, F., Rozeau, O., Hartmann, J. M., Vizioz, C., Comboroure, C., Andrieu, F., Barbe,

Year:

2017

Language:

english

File:

PDF, 921 KB

english, 2017

8

(Invited) Strain-Enhanced Performance of Si-Nanowire FETs

Casse, M., Barraud, S., Coquand, R., Koyama, M., Cooper, D., Vizioz, C., Comboroure, C., Perreau, P., Maffini-Alvaro, V., Tabone, C., Tosti, L., Barnola, S., Delaye, V., Aussenac, F., Ghibaudo, G., Iw

Journal:

ECS Transactions

Year:

2013

Language:

english

File:

PDF, 944 KB

english, 2013

9

Improvement of high resolution lithography by using amorphous carbon hard mask

S. Pauliac-Vaujour, P. Brianceau, C. Comboroure, O. Faynot

Journal:

Microelectronic Engineering

Year:

2008

Language:

english

File:

PDF, 801 KB

english, 2008

10

[IEEE 2012 13th International Conference on Ultimate Integration on Silicon (ULIS) - Grenoble, France (2012.03.6-2012.03.7)] 2012 13th International Conference on Ultimate Integration on Silicon (ULIS) - Scaling of high-k/metal-gate Trigate SOI nanowire transistors down to 10nm width

Coquand, R., Barraud, S., Casse, M., Leroux, P., Vizioz, C., Comboroure, C., Perreau, P., Ernst, E., Samson, M.-P., Maffini-Alvaro, V., Tabone, C., Barnola, S., Munteanu, D., Ghibaudo, G., Monfray, S.

Year:

2012

Language:

english

File:

PDF, 609 KB

english, 2012

11

The Context of Sexual Health in France and New National Sexual Health Strategy 2017–2030

Troussier, Thierry, Comboroure, Jean-Christophe

Journal:

The Journal of Sexual Medicine

Year:

2017

Language:

english

File:

PDF, 126 KB

english, 2017

12

[IEEE 2010 IEEE Symposium on VLSI Technology - Honolulu, HI, USA (2010.06.15-2010.06.17)] 2010 Symposium on VLSI Technology - Single dopant impact on electrical characteristics of SOI NMOSFETs with effective length down to 10nm

Wacquez, R., Vinet, M., Pierre, M., Roche, B., Jehl, X., Cueto, O., Verduijn, J., Tettamanzi, G. C., Rogge, S., Deshpande, V., Previtali, B., Vizioz, C., Pauliac-Vaujour, S., Comboroure, C., Bove, N.,

Year:

2010

Language:

english

File:

PDF, 1.95 MB

english, 2010

13

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, United States (Sunday 22 February 2015)] Optical Microlithography XXVIII - Progresses in 300mm DUV photolithography for the development of advanced silicon photonic devices

Lai, Kafai, Erdmann, Andreas, Baudot, Charles, Szelag, Bertrand, Allouti, Nacima, Comboroure, Corinne, Bérard-Bergery, Sébastien, Vizioz, Christian, Barnola, Sébastien, Gays, Fabien, Mariolle, Denis,

Year:

2015

Language:

english

File:

PDF, 884 KB

english, 2015

14

[IEEE 2012 IEEE Symposium on VLSI Technology - Honolulu, HI, USA (2012.06.12-2012.06.14)] 2012 Symposium on VLSI Technology (VLSIT) - Strain-induced performance enhancement of tri-gate and omega-gate nanowire FETs scaled down to 10nm Width

Coquand, R., Casse, M., Barraud, S., Leroux, P., Cooper, D., Vizioz, C., Comboroure, C., Perreau, P., Maffini-Alvaro, V., Tabone, C., Tosti, L., Allain, F., Barnola, S., Delaye, V., Aussenac, F., Reim

Year:

2012

Language:

english

File:

PDF, 1.01 MB

english, 2012

15

SPIE Proceedings [SPIE Microelectronic Manufacturing '99 - Santa Clara, CA (Wednesday 22 September 1999)] Multilevel Interconnect Technology III - Lithographic CD variation in contact, via, local interconnect, and damascene levels

Trouiller, Yorick, Didiergeorges, Anne, Fanget, Gilles L., Laviron, Cyrille, Comboroure, Corinne, Quere, Yves, Graef, Mart, Patel, Divyesh N.

Year:

1999

Language:

english

File:

PDF, 707 KB

english, 1999

16

Performance of Omega-Shaped-Gate Silicon Nanowire MOSFET With Diameter Down to 8 nm

Barraud, S., Coquand, R., Casse, M., Koyama, M., Hartmann, J.-M., Maffini-Alvaro, V., Comboroure, C., Vizioz, C., Aussenac, F., Faynot, O., Poiroux, T.

Journal:

IEEE Electron Device Letters

Year:

2012

Language:

english

File:

PDF, 430 KB

english, 2012

17

Hybrid high resolution lithography (e-beam/deep ultraviolet) and etch process for the fabrication of stacked nanowire metal oxide semiconductor field effect transistors

S. Pauliac-vaujour, C. Comboroure, C. Vizioz, S. Barnola, P. Brianceau, V. M. Alvaro, C. Dupré, T. Ernst

Year:

2008

Language:

english

File:

PDF, 1.40 MB

english, 2008

18

Hybrid deep UV–e-beam lithography for the fabrication of dual damascene structures

L Mollard, S Tedesco, B Dal’zotto, V Jaubert, L Pain, G Fanget, C Comboroure, Y Morand, M Fayolle

Journal:

Microelectronic Engineering

Year:

2001

Language:

english

File:

PDF, 480 KB

english, 2001

19

[IEEE 2012 4th IEEE International Memory Workshop (IMW) - Milan, Italy (2012.05.20-2012.05.23)] 2012 4th IEEE International Memory Workshop - Physical Understanding of Program Injection and Consumption in Ultra-Scaled SiN Split-Gate Memories

Masoero, L., Molas, G., Della Marca, V., Gely, M., Cueto, O., Colonna, J. P., De Luca, A., Brianceau, P., Charpin, C., Lafond, D., Delaye, V., Aussenac, F., Carabasse, C., Pauliac, S., Comboroure, C.,

Year:

2012

Language:

english

File:

PDF, 1.04 MB

english, 2012

To build up a library is to create a life. It’s never just a random collection of books.

— Carlos María Domínguez

Official channel

Z-Library Desktop Launcher

Z-Library Since 2009 support@1delivery.pm

EnglishРусскийEspañolItalianoελληνικάاللغة العربيةBahasa IndonesiaBahasa Malaysiaहिन्दीDeutschFrançaisPortuguêsУкраїнськаPolski中文繁體中文日本語Tiếng ViệtAzərbaycan DiliՀայոց լեզուภาษาไทยTürk Diliქართველიবাংলাپښتوతెలుగుاردو한국어SrpskiБългарски